FOR
IMMEDIATE RELEASE
ARP Demonstrated non-destructive sub-surface scanning
with 1 nm resolution
with 1 nm resolution
Harrisburg,
PA, November 21, 2011 — Applied Research & Photonics (ARP) (http://arphotonics.net) has demonstrated
its terahertz technology at the Eastern Analytical Symposium (EAS). ARP's new product, TeraScanR (TSR), can scan the inner layers of a multilayered structure with 1 nanometer resolution in a non-invasive way. There are challenges to quantify analyte concentration profile in the inner layers. Terahertz interaction with materials provides much higher sensitivity because
the probing frequencies are sensitive to the vibration of molecules as a whole
as opposed to just a bond or torsion. ARP’s TSR has received
the 2011 Innovation Award from the CLEO/Laser Focus World: http://www.cleoconference.org/home/news-and-press/cleo-press-releases/cleo-press-releases-2011/applied-research-and-photonics,-inc-receives-2011/
Dr. Amanda Norbutus scanning her rock sample by ARP's TSR at the EAS expo.
Functionality
of Terahertz Scanning Reflectometer
A proprietary CW
terahertz source is used that generates the terahertz
radiation from an electro-optic dendrimer. The terahertz beam is focused on to the
specimen at normal incidence. The
specimen cell is equipped with a scanning platform that allows direct
measurements as follows. The off-axis
parabolic reflector is adjusted such that initially the terahertz beam remains
focused on the substrate surface. At
this position the motion control can be engaged for scanning the substrate to
interrogate the reflectance across its thickness; this gives the concentration gradient, dC/dx, when the blank substrate is used as a reference. However, when the beam
remains focused at the surface and the motion control is locked at that
position, then the ingredient may be applied on the blank substrate to let it
permeate while the reflectance is measured in real
time. In this case the reflectance is
directly proportional to the rate of permeation of the ingredient across the
substrate, dC/dt. Knowing both dC/dx and dC/dt, the diffusion coefficient can
be calculated directly from the Fick’s second law. All measurements of the TSR are controlled by
the front-end interface with a Windows PC.
About
Applied Research & Photonics
Located in Harrisburg, PA,
Applied Research & Photonics, Inc. (ARP) is a nanotechnology company with
the core products in the terahertz area. ARP has demonstrated a number of products
based on its proprietary dendrimer based nanotechnology. ARP’s terahertz spectrometer, TeraSpectra,
uses a high-power terahertz source enabling high resolution spectrometry. It has a wider terahertz range (up to ~30 THz)
for probing molecular phenomena on time scales from a few femto-seconds to a
few tens of pico-seconds. Designed and
manufactured in Harrisburg, TeraSpectra offers the capability of solving a
number of problems in biomolecular, pharmaceutical, analytical and other
research areas. ARP is also working with
the US Department of Homeland Security to develop remote detection of
explosives for anti-terrorism applications.
For more information, visit ARP web site at: www.arphotonics.net or
contact:
Dr.
Anis Rahman
Applied Research and Photonics, Inc.
470
Friendship Road, Suite 10
Harrisburg,
PA 17111, USA
Phone: +1 (717) 623-8201
Email:
info@arphotonics.net
